The first edition of JPCA-EB01 was prepared by the JPCA Embedded Device Standardization Committee
in 2008 to cover the basics of embedded device board technology covering concept of device
embedding, structure, test methods, specification and product quality. This edition included
very basics of the technology in the concept partly based on JIS C 5012 - Test methods of printed
wiring board, a document prepared based on a JPCA document. The document was revised every year
for the second edition in 2009 and the third edition in 2010 together with cooperation of the
EPADs Study Group (Embedded Passive and Active Devices) of JIEP (Japan Institute of Electronic
Packaging). These editions included design of TEG as a dummy chip for embedded device tests,
drop test, vibration test and bending of device embedded board. The present 4th edition is
prepared employing the information included in JPCA-PB02 - Printed wiring board. The present
edition includes embedding of semiconductor bare dies and micro-integrated passive components
as the use of module substrate, classification of print wiring board, together with additional
information on new product specifications which are of importance to new products.
(Note added in proof: The second edition of JPCA-EB01 was submitted to IEC (International
Electrotechnical Commission) TC91 - Technical Committee in Electronics Assembly Technology in 2009
to be prepared as an international standard in 2009, as a PAS (Publically available information)
and NP (New work proposal). PAS has been published in 2010 as an official publication of IEC as
a technical information source, and NP was also approved and now in process of bringing it to an
international standard. IEC TC91 has organized a new WG (working group) to discuss this specific
technology in 2009 with Convenor by a member of JPCA. EB01 has been also introduced to meetings
of JIC (JISSO International Commission) and to IPC in the US. EB01 has been known around the
world as a new technology information source by experts in electronics technology.)
|